产品中心
产品详情
所在位置: 首页> 产品目录> Ossila> 仪器>
查看大图
你添加了1件商品 查看购物车
简单介绍：
Ossila经销商、原装进口、质量保证、更多“Ossilas四点探针”产品信息请联系我司销售。
详情介绍：

Ossilas四点探针介绍

Part of the Institute of Physics award-winning Ossila Solar Cell Prototyping Platform, the Ossila Four-Point Probe System is an easy-to-use tool for the rapid measurement of sheet resistance, resistivity, and conductivity of materials.

Built with a high-specification Ossila Source Measure Unit at its core, the Ossila Four-Point Probe is a low-cost system that allows a wide measurement range. The probe head uses spring-loaded contacts instead of sharp needles, preventing damage to delicate samples, such as polymer films with thicknesses on the order of nanometres. The price includes a four-point probe, in-built source measure unit, easy-to-use PC software, and an ITO-coated glass substrate. With free tracked worldwide shipping as standard, more laboratories across the globe can now measure sheet resistance to empower their materials characterisation and thin-film development programs.

The Ossila Four-Point Probe is backed by the Ossila Guarantee and is covered by our FREE 2-year warranty.



What is a Four-Point Probe?

The four-point probe is the most commonly-used piece of equipment for measuring the sheet resistance of a material. Sheet resistance is the resistivity of a material divided by its thickness, and represents the lateral resistance through a thin square of conducting/semiconducting material. This measurement uses four probes arrayed in a line, with equal spacing between each probe. A current is passed between the outer two probes, causing a reduction in voltage between the inner two probes. By measuring this change in voltage, the sheet resistance can then be calculated.


Four-Point Probe Measurement Specifications

Voltage range ±100 μV to ±10 V
Current range ±1 μA to ±200 mA
Sheet resistance range 100 mΩ/□ to 10 MΩ/□ (ohms per square)

 

Sheet Resistance Accuracy* Precision** Measured at Range
100 mΩ/□ ±8% ±3% 200 mA
1 Ω/□ ±2% ±0.5% 200 mA
10 Ω/□ ±1% ±0.5% 200 mA
100 Ω/□ ±1% ±0.05% 20 mA
1 kΩ/□ ±1% ±0.03% 20 mA
10 kΩ/□ ±1% ±0.02% 2000 µA
100 kΩ/□ ±2% ±0.05% 200 µA
1 MΩ/□ ±8% ±0.5% 20 µA
10 MΩ/□ ±30% ±5% 20 µA

*Accuracy is the maximum deviation from the true value.

** Precision is the maximum deviation between identical measurements (useful for comparative measurements).

Physical Device Specifications

Probe Spacing 1.27 mm
Rectangular Sample Size Range Long Edge Minimum: 5 mm Short Edge Maximum: 60 mm
Circular Sample Size Range (Diameter) 5 mm to 76.2 mm
Maximum Sample Thickness 10 mm
Overall Dimensions Width: 145 mm Height: 150 mm Depth: 240 mm
Four-point probe close up
Close up of the four point probe



Applications

Sheet resistance is an important property of materials, which is commonly used in material characterisation and in the development of thin-film devices such as perovskite solar cells or organic LEDs.

Material Characterisation

Resistivity is an inherent characteristic of a material, and an important electrical property. It can be determined by measuring the sheet resistance of a thin film with a known thickness, making the four-point probe measurement a key technique for the electrical characterisation of materials.

Thin-Film Solar Cells and LEDs

Thin-film devices require thin conducting electrodes that transport electrical charge laterally to be extracted, so materials with low sheet resistances are required to reduce potential losses. This becomes even more important when attempting to scale up these devices, as the electrical charges must travel further along the electrodes before they can be extracted.

Please note, this system is not suitable for silicon or other materials which naturally form insulating oxide layers. To measure such materials, the oxide layer needs to be penetrated by the probes, which may not be possible with the spring-loaded, round tipped probes utilised by this system.

Ossila Four-Point Probe
The Ossila Four-Point Probe has a small lab-footprint, but a wide measurement range

Included with the Ossila Four-Point Probe

The Four-Point Probe Unit

Built-in Ossila Source Measure UnitBuilt-in Ossila Source Measure Unit

The Ossila Four-Point Probe is powered by our Source Measure Unit. Supplied with a 24 V / 2 A power adapter and USB-B cable.

For more information, please refer to the Source Measure Unit product page.

Four-point probe head

Four-point probe head

Providing a constant contact force of 60 grams, the spring-loaded four point probe head is perfect for delicate samples. The probes are gold-plated to ensure good electrical contact is made without excess force, and are rounded to further prevent them from causing damage to thin films and other fragile samples (note that they are not suitable for silicon or other materials with insulating oxide layers).

Linear translation stage


Linear translation stage

With micrometer height control and a sample stage with non-slip rubber






姓名：
电话：
您的需求：