多功能TEM标样是在多孔碳膜上沉积金颗粒制得。通过观察微孔边缘和孔内多晶金颗粒的晶格间距测定TEM分辨率。通过观察碳在金膜中孔的沉积速率,也用于污染速率测量。
This specimen is also used for contamination measurement rates in the electron microscope by noting the deposition rate of carbon within the holes found in the gold film.